An ultrafast cryo-electron microscopy (cryo-UEM) system based on an ultrafast laser was established.
Diffraction-intensity fading curves and critical doses of samples were measured under different conditions.
The radiation damage in soft-matter samples did not show any dependence on the imaging electron dose rates.
The pulsed electron beams cannot mitigate the radiation damage in room-temperature and cryogenic samples.
The physical mechanisms behind the experimental results of radiation damage were systematically analyzed.
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Experimental procedures for ultrafast pulsed electron imaging on C44H90 crystals.
Electron radiation damage of C44H90 crystals in conventional continuous electron-beam mode and at different temperatures (300 K, 200 K and 140 K)
Electron radiation damage of C44H90 crystals in ultrafast multi-electron-packet pulsed electron-beam mode at different temperatures
Electron radiation damage of C44H90 crystals in ultrafast near-single-electron-packet pulsed electron-beam mode at different temperatures
Electron radiation damage of C44H90 crystals at 100 kHz laser repetition rate and 300 K