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Research progress on the working mechanisms of QLEDs based on novel characterization methods

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  • Corresponding authors: boning@dicp.ac.cn (B.W.);  schang@smbu.edu.cn (S.C.)
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    1. Advanced operando and multiscale characterization of Quantum-dot light emitting diodes (QLEDs).

      Investigation of carrier dynamics, charge imbalance, interfacial interactions, and QLED degradation.

      Future directions and challenges toward highly efficient and stable QLED technologies.

  • Quantum-dot light-emitting diodes (QLEDs) have great potential to deliver next-generation displays and lighting, yet it is difficult to achieve improvements in external quantum efficiency (EQE), roll-off, and reasonably operational stability due to their coupled process, such as charging-injection imbalance, carrier accumulation/leakage, field-induced effects, interfacial quenching, and irreversible degradation, which are hard to isolate with conventional steady-state measurement. The techniques of multiscale and operando characterization methods are summarized in this review and arranged in a hierarchical manner of diagnostic tools connecting observables to quantitative parameters and design rules applicable to devices. Single-dot photoluminescence (PL)/electroluminescence (EL) with photon-correlation and time-resolved detection discloses the intermittency during charging, the Auger loss, and charge-state signal injection/recombination rates at the bias. For the device level, injection delay is measured with single carrier structures and transient electroluminescence/current (TREL/TRC) measurement systems, and electrically excited transient absorption (ETA) is employed to inseparably isolate the carrier distributions of charge storage and recombination and leakage of quantum-confined Stark effect (QCSE). Additionally, electroabsorption (EA) tracks layer-resolved internal-field evolution and voltage-loss pathways during aging. The approaches used to differentiate between interfacial quenching and permanent damage, and localize the hotspots driven failure are complementary: nanosecond transient absorption (ns-TA), in-situ EL/PL, and time-gated mapping. These advanced characterization methods provide a deeper understanding of working mechanisms, enabling the development of more effective strategies to enhance the efficiency, stability, and long-term performance of QLEDs in practical applications.
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  • Cite this article:

    Zhao Y., Wu B., Li B., et al. (2026). Research progress on the working mechanisms of QLEDs based on novel characterization methods. The Innovation Materials 4:100223. https://doi.org/10.59717/j.xinn-mater.2026.100223
    Zhao Y., Wu B., Li B., et al. (2026). Research progress on the working mechanisms of QLEDs based on novel characterization methods. The Innovation Materials 4:100223. https://doi.org/10.59717/j.xinn-mater.2026.100223

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